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Data Analytics
Semiconductor Chip Lifecycle Data Analysis, Insights, and Control System

How to extract the value from big data?

In the current era of semiconductor manufacturing processes, data-intensive adjustments are becoming increasingly important. In addition to technical adjustments to improve yields, it is especially critical to analyze data through the end-to-end whole industry chain.
Unified Data Management
Fast access and integration of massive data from all sources
Accelerate product development and improve yield rate
Effective management of supply chain
Efficient Analysis Platform
Provide efficient, targeted analysis capabilities
Effectively help companies improve yield and product performance
Data Visualization
Simple software that offers extended functionality
Quickly update data
Quickly analyze and create visual charts
DataExp: a balance between fast browsing and in-depth analysis

 

  • Unified data management

    Support test data, process parameters, wafer defect data and images, etc.
    Import and unified management of multiple types of data

  • Data Dashboard Configuration

    Rich out-of-the-box data dashboards are available to meet the needs of IC
    The field of data analysis meets the needs of daily viewing and monitoring data

  • Visualization and High Interaction
    The platform's visualized, highly interactive application front-end is convenient for diverse and flexible data analysis
     
  • Distributed Data Management
    The underlying data architecture uses the latest distributed database and management system to guarantee effective and fast access/data integration with flexible scalability
    Easy to derive other applications on top of the platform

Overview

DE-G
General Semiconductor Data Analysis
DE-YMS
Fab Inline and Yield Data Analysis
DE-DMS
Defect Management Analysis System
INF-AI
One-stop AI Solution Platform for Semiconductor Manufacture
INF-ADC
Automatic Defect Classification System
INF-WPA
An Intelligent and Efficient Platform for Wafer Pattern Analysis
DE-RF
RF Data Analysis Software
DE-FDC
Equipment Monitoring System
DE-SPC
Statistical Process Control System
DE-Alarm
An Intelligent Yield and Quality Anomaly Detection and Alarming System
DE-iCASE
AI Empowered Defect Analysis/ Case Tracking System Platform
Data Analytics
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