During the process of IC product development, manufacturing and qualification, the demand for parametric testing is rapidly increasing. With over ten years of independent research and development, Semitronix has developed its own high efficiency parametric testers. Semitronix‘s testers have been successfully adopted by many leading design houses (Fabless), manufacturing foundries (Fab), integrated device manufacturing companies (IDM) and R&D labs, helping customers completing various test tasks, efficiently and accurately extracting device and process-related electrical parameters, and enabling data-driven power-performance-area-cost (PPAC) optimization, high reliability and yield enhancement of chip products.

Currently, Semitronix‘s testers are used in the following applications: highly parallel R&D testing, highly efficient WAT mass production testing, and wafer level reliability (WLR) testing. In the future, Semitronix will expand its product portfolio to cover more testing applications and meet new testing demands in the market.